2 Produkt
| Bild | Modell | Preis | Anzahl | Lager | Hersteller | Beschreibung | Package / Case | Series | Packaging | Number of Bits | Logic Type | Mounting Type | Operating Temperature | Part Status | Supplier Device Package | Factory Stock | Minimum Quantity | Supply Voltage | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
siehe | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 24-DIP (0.300", 7.62mm) | 74BCT | Tube | 8 | Scan Test Device with Buffers | Through Hole | 0°C ~ 70°C | Obsolete | 24-PDIP | 0 | 60 | 4.5 V ~ 5.5 V | |||
|
|
|
siehe | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 24-DIP (0.300", 7.62mm) | 74BCT | Tube | 8 | Scan Test Device with Buffers | Through Hole | 0°C ~ 70°C | Obsolete | 24-PDIP | 0 | 60 | 4.5 V ~ 5.5 V |
1 / 1 Seite
