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5 Produkt
| Bild | Modell | Preis | Anzahl | Lager | Hersteller | Beschreibung | Package / Case | Series | Packaging | Number of Bits | Logic Type | Mounting Type | Operating Temperature | Part Status | Supplier Device Package | Factory Stock | @ qty | Minimum Quantity | Supply Voltage | |
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siehe | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 24-DIP (0.300", 7.62mm) | 74BCT | Tube | 8 | Scan Test Device with Buffers | Through Hole | 0°C ~ 70°C | Obsolete | 24-PDIP | 0 | 0 | 60 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 24-DIP (0.300", 7.62mm) | 74BCT | Tube | 8 | Scan Test Device with Buffers | Through Hole | 0°C ~ 70°C | Obsolete | 24-PDIP | 0 | 0 | 60 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | 8 | Scan Test Device with Buffers | Surface Mount | 0°C ~ 70°C | Discontinued at Digi-Key | 24-SOIC | 0 | 0 | 2000 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | 8 | Scan Test Device with Buffers | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 0 | 0 | 50 | 4.5 V ~ 5.5 V | |||
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Ein Angebot |
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Verfügbar auf Lager
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | 8 | Scan Test Device with Buffers | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 450 | 0 | 1 | 4.5 V ~ 5.5 V |
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