- Packaging :
- Supplier Device Package :
9 Produkt
| Bild | Modell | Preis | Anzahl | Lager | Hersteller | Beschreibung | Package / Case | Series | Packaging | Number of Bits | Logic Type | Mounting Type | Operating Temperature | Part Status | Supplier Device Package | Factory Stock | Minimum Quantity | Supply Voltage | |
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siehe | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 28-SOIC (0.295", 7.50mm Width) | 74ABT | Tape & Reel (TR) | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SOIC | 0 | 1000 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 28-SOIC (0.295", 7.50mm Width) | 74ABT | Tape & Reel (TR) | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SOIC | 0 | 1000 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TESST DEVICE 28-SSOP | 28-BSSOP (0.295", 7.50mm Width) | 74ABT | Tape & Reel (TR) | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SSOP | 0 | 1000 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TESST DEVICE 28-SSOP | 28-BSSOP (0.295", 7.50mm Width) | 74ABT | Tape & Reel (TR) | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SSOP | 0 | 1000 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 28-SOIC (0.295", 7.50mm Width) | 74ABT | Tape & Reel (TR) | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SOIC | 0 | 1000 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 28-SOIC (0.295", 7.50mm Width) | 74ABT | Tape & Reel (TR) | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SOIC | 0 | 1000 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 28-BSSOP (0.295", 7.50mm Width) | 74ABT | Tape & Reel (TR) | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SSOP | 0 | 1000 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 28-BSSOP (0.295", 7.50mm Width) | 74ABT | Tube | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SSOP | 0 | 40 | 4.5 V ~ 5.5 V | |||
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siehe | Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 28-SOIC (0.295", 7.50mm Width) | 74ABT | Tube | 8 | Scan Test Device with Registered Bus Transceiver | Surface Mount | -40°C ~ 85°C | Obsolete | 28-SOIC | 0 | 60 | 4.5 V ~ 5.5 V |
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